Dissertation theses
Approximate Logic Circuits Testing
So called “approximate” logic circuits are one of contemporary mainstreams in logic design. Here the logic circuit needs not compute the desired function exactly, some error is tolerated. The main purpose of designing such circuits is a significantly reduced area and power consumption. Approximate circuits find application in image/audio processing and recognition, neural networks, data-mining, etc.
Testing of these circuits now becomes a new challenging task. Test generation for approximate circuits offers more degrees of freedom: the test needs not be complete, not all faults need to be tested in order to comply with the approximation demands. As a result, the test can be shorter.
The aim of the research will be to design novel Automated Test Patterns Generation (ATPG) algorithms for approximate circuits.
Artificial Intelligence in Logic Synthesis
Algorithms used to design digital circuits (EDA algorithms) are usually of a greedy nature. Local decisions are made randomly, or based on topological structure, or by the algorithm designer’s experience. These decisions need not be well chosen, resulting in inferior result quality. To resolve this problem, AI strategies can be incorporated into EDA algorithms. Here the AI learns in the EDA process and then helps in the subsequent processing.
The aim of the research is to analyze possibilities of application of AI in logic synthesis algorithms and devise new AI-guided logic synthesis algorithms.
Improvements in the Logic Synthesis and Optimization Process Control
Contemporary logic synthesis and optimization tools (both commercial and academic) mostly emphasize computational speed, at expense of result quality. Our recent research has shown that these tools tend to get stuck in deep local optima, and therefore they often produce very inferior results (in terms of area and/or delay). One of the reasons for it is a deterministic nature of the algorithms. Randomization of the algorithms has been found to be a viable, but just partial solution to this problem [1], [2]. The second, and more important reason of failure is the lack of a global algorithm control. Most of present logic synthesis and optimization algorithms are of an iterative nature, whereas their individual parts (elementary operations) are executed essentially ad-hoc and speculatively. Implementation of efficient top-level algorithm control means should significantly improve performance of logic synthesis and optimization.
The aim of the research is to investigate the behavior of individual elementary synthesis steps (e.g., in the ABC synthesis tool [3]), determine their dependence and orthogonality, and devise an improved overall algorithm control.
- [1] P. Fišer and J. Schmidt, “Improving the Iterative Power of Resynthesis,” in Proc. of 15th IEEE Symposium on Design and Diagnostics of Electronic Systems (DDECS), Tallinn (Estonia), April 18-20, 2012, pp. 30-33.
- [2] P. Fišer and J. Schmidt, “On Using Permutation of Variables to Improve the Iterative Power of Resynthesis,” in Proc. of 10th Int. Workshop on Boolean Problems (IWSBP), Freiberg (Germany), September 19-21, 2012, pp. 107-114.
- [3] Berkeley Logic Synthesis and Verification Group, “ABC: A System for Sequential Synthesis and Verification” [Online]. Available: http://www.eecs.berkeley.edu/alanmi/abc/.
Randomized Iterative Algorithms in Logic Synthesis
Contemporary logic synthesis and optimization tools (both commercial and academic) mostly emphasize computational speed, at expense of result quality. Our recent research has shown that these tools tend to get stuck in deep local optima, and therefore they often produce very inferior results (in terms of area and/or delay). Randomized iterative algorithms seem to efficiently solve this problem [1], [2] – they offer a trade-off between the run-time and result quality.
Moreover, present studies have shown that most of logic synthesis and optimization tools are very sensitive to randomness accidently introduced “from outside”, by the designer itself [3], [4]. Synthesis then produces results significantly differing in quality, when only slight changes in the source circuit description are made. Such a behavior is highly unwanted. Thus, it is required to analyze this behavior, determine its reasons, and to suggest more efficient algorithms.
The aim of the research is to analyze selected logic synthesis and optimization algorithms [5], identify the reasons of the above-mentioned behavior, and identify points, where randomness can be introduced. The influence of randomness will be then analyzed and algorithms exploiting the randomness in a positive way will be devised [3], [4]. Next, new algorithms minimizing the sensitivity on the external randomness will be developed.
- [1] P. Fišer and J. Schmidt, “Improving the Iterative Power of Resynthesis,” in Proc. of 15th IEEE Symposium on Design and Diagnostics of Electronic Systems (DDECS), Tallinn (Estonia), April 18-20, 2012, pp. 30-33.
- [2] P. Fišer and J. Schmidt, “On Using Permutation of Variables to Improve the Iterative Power of Resynthesis,” in Proc. of 10th Int. Workshop on Boolean Problems (IWSBP), Freiberg (Germany), September 19-21, 2012, pp. 107-114.
- [3] A. Puggelli, T. Welp, A. Kuehlmann, and A. Sangiovanni-Vincentelli, “Are Logic Synthesis Tools Robust?,” in Proc. of the 48th ACM/EDAC/IEEE Design Automation Conference (DAC), 5-9 June 2011, pp. 633-638.
- [4] P. Fišer, J. Schmidt, and J. Balcárek, “On Robustness of EDA Tools,” in Proc. of 17th Euromicro Conference on Digital Systems Design (DSD), Verona (Italy), August 27-29, 2014, pp. 427-434.
- [5] Berkeley Logic Synthesis and Verification Group, “ABC: A System for Sequential Synthesis and Verification” [Online]. Available: http://www.eecs.berkeley.edu/alanmi/abc/.
Test Compression for ASIC Circuits
With the increasing complexity of presently manufactured chips, increasingly more data must be delivered to individual chip cores to test them. Compression of this data becomes now inevitable, because of the high cost of the ATE memory and test time expenses. The ratio of expenses spent by chip testing and its development is increasing. Therefore, test compression is and will increasingly be a hot topic. It is very challenging to contribute to the research in this area and to try to overcome established industrial tools in performance.
Different test compression mechanisms have been proposed, some of them are used in industry [1], [2]. Most of them rely on a combination of pseudo-random testing (and possibly BIST), which can be implemented on-chip as whole and does not need any data to be transmitted, and deterministic test. The deterministic test is algorithmically compressed, stored in the ATE memory, and decompressed on-chip.
The aim of the research is to design test compression/decompression methods based on advanced design-for-testability (DFT) architectures [3]. This will comprise of a design of possibly novel decompression architectures, algorithms for test compression for these architectures, and design of the overall HW architecture, where test decompression, BIST and various DFT features will be implemented.
This research will (can) follow up a successfully completed Ph.D. thesis [4], [5].
- [1] J. Rajski et al. “Embedded Deterministic Test”, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 23, no. 5, pp. 776-792, 2004.
- [2] Y. Huang, S. Milewski, J. Rajski, J. Tyszer and C. Wang, “Low Cost Hypercompression of Test Data,” IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 39, no. 10, pp. 2964-2975, 2020.
- [3] R. Dorsch, H. Wunderlich, “Reusing Scan Chains for Test Pattern Decompression”, Journal of Electronic Testing: Theory and Applications, vol. 18, no. 2, pp. 231-240, 2002.
- [4] J. Balcárek, P. Fišer, and J. Schmidt, “Techniques for SAT-based Constrained Test Pattern Generation,” in Microprocessors and Microsystems, Elsevier, Vol. 37, Issue 2, March 2013, pp. 185-195. [5] J. Balcárek, „Implicit Representations in Testing and Dependability of Digital Circuits“, Ph.D. Thesis, CTU in Prague, 2016.
- [5] J. Balcárek, „Implicit Representations in Testing and Dependability of Digital Circuits“, Ph.D. Thesis, CTU in Prague, 2016.